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Thin Film Processes and Characterization Techniques: A Comprehensive Guide- Vendor:
Diana Moore
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Thin Film Processes and Characterization Techniques: A Comprehensive Guide
$18.70
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- A comprehensive guide to thin film processes and characterization techniques, covering all aspects from deposition to characterization.
- Provides a detailed overview of the different thin film deposition techniques, including physical vapor deposition, chemical vapor deposition, and molecular beam epitaxy.
- Discusses the various characterization techniques used to analyze thin films, including X-ray diffraction, atomic force microscopy, and scanning electron microscopy.
- Includes case studies and examples to illustrate the practical applications of thin film processes and characterization techniques.
- Written by a team of experts in the field, this book is an essential resource for researchers, engineers, and students working with thin films.
Condition: New original from publisher
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