Recent Advances In Pmos Negative Bias Temperature Instability: Characterization And Modeling Of Device Architecture, Material, And Process Impact

Reviews (0)

Ratings

0.0

0 Product Ratings
5
0
4
0
3
0
2
0
1
0

Review this product

Share your thoughts with other customers

Write a review

Reviews

There are no reviews yet.

Engineering & Transportation

Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material, and Process Impact

$21.80

Available in stock

  • Explores the latest research on PMOS NBTI, a critical reliability issue in modern CMOS technology.
  • Provides a comprehensive overview of the characterization and modeling of NBTI in PMOS devices.
  • Covers the impact of device architecture, material properties, and process conditions on NBTI.
  • Presents advanced modeling techniques for predicting NBTI behavior and optimizing device design.
  • Offers practical insights for improving the reliability of PMOS devices in real-world applications

Quantity:
ISBN: 9811661197 Categories: , Author:

Condition: New original from publisher

Sold By

Diana Moore
Store
Diana Moore

0.00 (0 Reviews)

People Also Viewed

Java: A Beginner’s Guide, 10th Edition by Herbert Schildt
Java: A Beginner’s Guide, 10th Edition by Herbert Schildt
$18.29
 Transformers for Natural Language Processing and Computer Vision: Generative AI, Large Language Models, and Beyond with Hugging Face, ChatGPT, GPT-4V, and DALL-E 3
Transformers for Natural Language Processing and Computer Vision: Generative AI, Large Language Models, and Beyond with Hugging Face, ChatGPT, GPT-4V, and DALL-E 3
$19.03

You May Like

Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material, and Process Impact $21.80
Share
Copy Link
[wcboost_compare_button][wcboost_wishlist_button]
Shopping Cart (1)

Subtotal (1 item) $21.80

CheckoutView cart

Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material, and Process Impact
$21.80
Add to cart