Provides a comprehensive overview of on-wafer calibration techniques for accurate characterization of high-performance silicon devices at mm-wave frequencies and beyond.
Covers a wide range of calibration methods, including open, short, load, and through (OSLT), as well as advanced techniques such as multi-line TRL and power-sensor-based calibration.
Presents detailed examples and case studies to illustrate the application of these techniques in real-world scenarios.
Discusses the limitations and challenges of on-wafer calibration and provides guidance on how to overcome them.
* Offers a valuable resource for researchers, engineers, and students working in the field of high-frequency device characterization.