No products in the cart.
Reviews (0)
Only logged in customers who have purchased this product may leave a review.
Practical Electron Microscopy of Lattice Defects: A Comprehensive Guide to Characterization and Analysis
$21.72
Available in stock
- A comprehensive guide to the characterization and analysis of lattice defects in materials using electron microscopy.
- Covers a wide range of topics, including the basics of electron microscopy, the different types of lattice defects, and the techniques used to characterize and analyze them.
- Written by a team of experts in the field, this book is an essential resource for anyone working with materials science or engineering.
- Includes over 500 high-quality images and illustrations to help readers understand the concepts discussed in the text.
- Provides a detailed glossary of terms and acronyms to help readers navigate the complex terminology used in the field.
Condition: New original from publisher
Sold By
Store
Reviews
There are no reviews yet.